Stitching of multiple scan chains. (multiple clock domains).
(different clock enable, posedge, negedge).
Automatically generated by the Test compiler for scan chains.
10 tips for successful scan design: part one & two - 2/17/2000 - EDN
http://www.edn.com/article/CA46603.html
http://www.edn.com/article/CA46604.html
www.evaluationengineering.com/archive/articles/0997dft.htm
-- Bharat Singh | rathorebharat
Monday, December 04, 2006
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