Monday, December 04, 2006

Lock up latches? Common uses?

Stitching of multiple scan chains. (multiple clock domains).
(different clock enable, posedge, negedge).

Automatically generated by the Test compiler for scan chains.

10 tips for successful scan design: part one & two - 2/17/2000 - EDN
http://www.edn.com/article/CA46603.html
http://www.edn.com/article/CA46604.html

www.evaluationengineering.com/archive/articles/0997dft.htm

-- Bharat Singh | rathorebharat

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